Author : Hiyam Chasib Majed, Ameera Jawad Kadhm and Israa Akram Abbas

In this work thin films ZrO2 have been irradiated by Gama rays .The film characteristics are Fromcs-1370.9uciat thin films were successfully deposited on suitably cleaned glass substrate at constant room temperature and different concentrations thicknesses different (330,450 and550)nm. Absorbed dose samples from the source is 2.67sv/h. XRD analysis detect that all the films were polycrystalline tetragonal with a choose orientation bearing (111) plane. At half-maximum full-width (FWHM) of the preferred orientation (111) for the material ZrO2.that the absorbance of all the films have high rate at a wavelength in the neighbourhood of the border of the essential absorption (280 nm), then the absorbance reduction with rising of wavelength. The reflectance in wavelength range about (275-385) nm increases with the decreasing of the film thickness, also increases with the increasing of the wavelength. In contrast, λ>385 nm the reflectance increases with the increasing of film thickness and decreases with increasing of the wavelength. The value of energy gap has been observed to depend on thickness, showing a slightly decreases as a thickness increase and the variations of refractive index with the wavelength of the accident photon. The conduct of this figure is similar to the behaviour of reflectance spectrum.

Keywords: Optical properties, transparent conducting, Zirconium dioxide, ray gamma element Cs137

Article published in International Journal of Current Engineering and Technology, Vol.7, No.2 (April-2017)