Studies on Mechanical and Electrical Properties of L-Alaninium Succinate NLO Active Single Crystal
Pages : 2447-2449
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Abstract
L-Alaninium Succinate (LAS) single crystals were grown by slow evaporation method. The Vicker’s microhardness test was carried out on the grown crystal. The dielectric studies are carried out and the nature of variation of dielectric constant and dielectric loss in the frequency range of 50 Hz to 5 MHz at different temperatures (30ºC, 60ºC and 90ºC) is studied and reported. Photoconductivity measurements were carried out on the grown crystal reveals the negative photoconducting nature.
Keywords: Single Crystal, Growth from solution, Microhardness, Dielectric constant, Dielectric loss and Photoconductivity Studies
Article published in International Journal of Current Engineering and Technology, Vol.4,No.4 (Aug- 2014)
MECHPGCON, MIT College of Engineering, Pune, India
AMET, MIT College of Engineering, Pune, India
International Conference on Advances in Mechanical Sciences 
International Symposium on Engineering and Technology
International Conference on Women in Science and Engineering
