Elevated Temperature – Humidity Tests and Electrical Analysis for the Assessment of Sheet Resistance and Power Loss in Photovoltaic Cells
Pages : 123-128
The life data analysis is an important piece of the pie, but performing just the analysis is not enough to achieve reliable products. Rather, there are a variety of activities involved in an effective reliability program and in arriving at reliable products. As part of this overall reliability effort, accelerated life tests were performed on PV modules to determine the effects of humidity on sheet resistance over time and its impact on the loss of power. This paper compares the sheet resistance and visible transmission of three materials Indium Tin Oxide (ITO), Gallium Zinc Oxide (GZO) and Aluminum Zinc Oxide (AZO). The paper gives an insight into the variation in sheet resistance at different environmental parameters like humidity and temperature. The results from accelerated ageing test were used for the analysis. An electrical analysis were made to study the improvement in power loss with sheet resistance.
Keywords: Indium Tin Oxide (ITO), Gallium Zinc Oxide (GZO) and Aluminum Zinc Oxide (AZO, Sheet resistance, Finger length, Finer spacing.
Article published in International Journal of Current Engineering and Technology, Vol.3,No.1 (March- 2013)